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    DATE
    2007
    IEEE
    100views Hardware» more  DATE 2007»
    SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
    14 years 7 months ago
    SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
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    Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
    Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon W...
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