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DATE
2005
IEEE
143
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DATE 2005
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Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies
15 years 4 months ago
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www.lems.brown.edu
Operating frequency of a pipelined circuit is determined by the delay of the slowest pipeline stage. However, under statistical delay variation in sub-100nm technology regime, the...
Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay,...
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