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24
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DAC
2006
ACM
141
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Computer Architecture
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DAC 2006
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Timing-based delay test for screening small delay defects
14 years 9 months ago
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www.engr.uconn.edu
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
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