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30
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VTS
2007
IEEE
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VTS 2007
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Optimizing Test Length for Soft Faults in DRAM Devices
14 years 6 months ago
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ce.et.tudelft.nl
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
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