Sciweavers

ET
2002
85views more  ET 2002»
13 years 11 months ago
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
Mehrdad Nourani, Amir Attarha