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DATE
2007
IEEE
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DATE 2007
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Slow write driver faults in 65nm SRAM technology: analysis and March test solution
14 years 4 months ago
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hal.archives-ouvertes.fr
∗ This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is t...
Alexandre Ney, Patrick Girard, Christian Landrault...
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