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    Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
    15 years 16 days ago
    Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
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    Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
    Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
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