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    VLSID
    2004
    IEEE
    135views VLSI» more  VLSID 2004»
    Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
    15 years 29 days ago
    Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
    Download  eprints.ecs.soton.ac.uk
    Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
    M. S. Gaur, Mark Zwolinski
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