DATE
2002
IEEE
15 years 1 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
ICSEA
2007
IEEE
15 years 2 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...