TASE
2008
IEEE
13 years 12 months ago
2008
IEEE
Abstract--Cluster tools are widely used as semiconductor manufacturing equipment. While throughput analysis and scheduling of single-cluster tools have been well-studied, research ...
TASE
2008
IEEE
13 years 12 months ago
2008
IEEE
Condition monitoring and fault diagnosis in modern manufacturing automation is of great practical significance. It improves quality and productivity, and prevents damage to machine...
TASE
2008
IEEE
13 years 12 months ago
2008
IEEE
The safety of pointer programs is an important issue in high-assurance software design, and their verification remains a major challenge. Pointer Logic has been proposed to verify...
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
Applications such as layered manufacturing, or in general, solid free-form fabrication, pose a major challenge on online process control. For these parts to be functional, it is i...
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
This paper addresses the design of single commodity stochastic distribution networks. The distribution network under consideration consists of a single supplier serving a set of re...
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
Abstract--We describe a vibratory part transport mechanism that utilizes both static and dynamic friction to linearly transport parts in a horizontal direction. We derive a horizon...
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
An automated system for planning and optimization of lumber production using Machine Vision and Computed Tomography (CT) is proposed. Cross-sectional CT images of hardwood logs are...
TASE
2008
IEEE
14 years 10 days ago
2008
IEEE
We address the sensor selection problem which arises in tracking and localization applications. In sensor selection, the goal is to select a small number of sensors whose measureme...