TCAD
2011
13 years 9 months ago
2011
—Escalating system-on-chip design complexity is the design community to raise the level of abstraction beyond register transfer level. Despite the unsuccessful adoptions of early...
TCAD
2011
13 years 9 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
TCAD
2011
13 years 9 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
TCAD
2011
13 years 9 months ago
2011
Abstract—This work introduces GRIP, a global routing technique via integer programming. GRIP optimizes wirelength and via cost directly without going through a traditional layer ...