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    Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
    14 years 5 months ago
    Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
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    Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
    Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...
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