VTS
1997
IEEE
14 years 3 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
VTS
2007
IEEE
14 years 5 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...