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    DATE
    2006
    IEEE
    134views Hardware» more  DATE 2006»
    Power constrained and defect-probability driven SoC test scheduling with test set partitioning
    14 years 12 months ago
    Power constrained and defect-probability driven SoC test scheduling with test set partitioning
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    1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
    Zhiyuan He, Zebo Peng, Petru Eles
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