DELTA
2006
IEEE
14 years 7 months ago
2006
IEEE
— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
ICCAD
2004
IEEE
14 years 10 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...