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35
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DFT
1998
IEEE
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VLSI
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DFT 1998
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A System for Evaluating On-Line Testability at the RT-level
14 years 4 months ago
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www.cad.polito.it
This paper presents a system to evaluate the testability of an on-line testable circuit. The system operates at the RT-level, before the logic synthesis step, and allows for an ex...
Silvia Chiusano, Fulvio Corno, Matteo Sonza Reorda...
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