Sciweavers

ICCD
2006
IEEE
105views Hardware» more  ICCD 2006»
14 years 6 months ago
A New Class of Sequential Circuits with Acyclic Test Generation Complexity
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
Chia Yee Ooi, Hideo Fujiwara