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37
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DFT
2003
IEEE
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VLSI
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DFT 2003
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Constrained ATPG for Broadside Transition Testing
14 years 4 months ago
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computing.ece.vt.edu
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao
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