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43
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ICCD
2003
IEEE
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ICCD 2003
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Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity
14 years 5 months ago
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www.utdallas.edu
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
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