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16
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ISQED
2010
IEEE
135
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ISQED 2010
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Signal probability control for relieving NBTI in SRAM cells
14 years 3 months ago
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www.c.csce.kyushu-u.ac.jp
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
Yuji Kunitake, Toshinori Sato, Hiroto Yasuura
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