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VTS
1996
IEEE
114views Hardware» more  VTS 1996»
14 years 4 months ago
Quantitative analysis of very-low-voltage testing
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
Jonathan T.-Y. Chang, Edward J. McCluskey
ITC
1996
IEEE
99views Hardware» more  ITC 1996»
14 years 4 months ago
Detecting Delay Flaws by Very-Low-Voltage Testing
The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A d...
Jonathan T.-Y. Chang, Edward J. McCluskey