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    2003
    IEEE
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    Fault Localization using Time Resolved Photon Emission and STIL Waveforms
    14 years 4 months ago
    Fault Localization using Time Resolved Photon Emission and STIL Waveforms
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    Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
    Romain Desplats, Felix Beaudoin, Philippe Perdu, N...
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