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    DAC
    2004
    ACM
    137views Computer Architecture» more  DAC 2004»
    Parametric yield estimation considering leakage variability
    14 years 13 days ago
    Parametric yield estimation considering leakage variability
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    Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
    Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
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