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ASPDAC
2006
ACM
100views Hardware» more  ASPDAC 2006»
14 years 5 months ago
Generation of shorter sequences for high resolution error diagnosis using sequential SAT
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moo...