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31
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EURODAC
1995
IEEE
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VHDL
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EURODAC 1995
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A unified approach to the extraction of realistic multiple bridging and break faults
14 years 3 months ago
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www.cs.york.ac.uk
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...
Gerald Spiegel, Albrecht P. Stroele
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