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31
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ISQED
2008
IEEE
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ISQED 2008
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Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas
14 years 5 months ago
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The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
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