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    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
    13 years 10 months ago
    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
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    Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...
    A. Benmansour, Stephane Azzopardi, J. C. Martin, E...
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