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29
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ICCAD
2010
IEEE
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ICCAD 2010
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Mathematical yield estimation for two-dimensional-redundancy memory arrays
13 years 9 months ago
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tiger.ee.nctu.edu.tw
Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This ...
Mango Chia-Tso Chao, Ching-Yu Chin, Chen-Wei Lin
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