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ICCAD
2008
IEEE
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ICCAD 2008
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Process variability-aware transient fault modeling and analysis
14 years 8 months ago
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www.ece.cmu.edu
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
Natasa Miskov-Zivanov, Kai-Chiang Wu, Diana Marcul...
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