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    ICCD
    2007
    IEEE
    98views Hardware» more  ICCD 2007»
    Evaluating voltage islands in CMPs under process variations
    14 years 8 months ago
    Evaluating voltage islands in CMPs under process variations
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    Parameter variations are a major factor causing powerperformance asymmetry in chip multiprocessors. In this paper, we analyze the effects of with-in-die (WID) process variations o...
    Abhishek Das, Serkan Ozdemir, Gokhan Memik, Alok N...
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