VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
In recent years, research and development in the field of machine learning and classification techniques have gained paramount importance. The future generation of intelligent e...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
As the VLSI technology scales towards the nanometer regime, circuit performance is increasingly affected by variations. These variations need to be considered at an early stage in...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
In this paper we demonstrate the impact of the floorplan on the temperature-dependent leakage power of a System on Chip (SoC). We propose a novel system level temperature aware a...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
The 3-2, 4-2 and 5-2 compressors are the basic components in many applications, in particular partial product summation in multipliers. In this paper novel architectures and desig...
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
In the past, Field Programmable Gate Array (FPGA) circuits only contained a limited amount of logic and operated at a low frequency. Few applications running on FPGAs consumed exc...
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
The Discrete Wavelet Transform (DWT) forms the core of the JPEG2000 image compression algorithm. Since the JPEG2000 compression application is heavily data-intensive, the overall ...
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
VLSID
2007
IEEE
15 years 29 days ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...