VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE
Attack resistance has been a critical concern for security-related applications. Various side-channel attacks can be launched to retrieve security information such as encryption k...
VTS
2007
IEEE
14 years 7 months ago
2007
IEEE