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VTS   2011 IEEE VLSI Test Symposium
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VTS
2011
IEEE
278views Hardware» more  VTS 2011»
13 years 4 months ago
Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories
This paper proposes an adaptive multi-bit error correcting code for phase change memories that provides a manifold increase in the lifetime of phase change memories thereby making...
Rudrajit Datta, Nur A. Touba
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