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DATE
2006
IEEE

On the relation between simulation-based and SAT-based diagnosis

14 years 5 months ago
On the relation between simulation-based and SAT-based diagnosis
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, equivalence checking and production test. Manually locating errors can be a time consuming and resource-intensive process. Several automated approaches for diagnosis have been presented, among them simulation-based and SAT-based techniques. These two approaches are found to be robust even for large circuits as well as being applicable to a broad range of diagnosis problems. An in-depth comparison of both approaches necessary to augment our knowledge of diagnosis procedures has not been addressed by previous work. This paper provides a thorough analysis of the similarities and differences between simulation-based and SAT-based procedures for diagnosis. The relation between the basic approaches is theoretically analyzed. Issues regarding performance and diagnosis quality (resolution) are discussed. Experimental ...
Görschwin Fey, Sean Safarpour, Andreas G. Ven
Added 10 Jun 2010
Updated 10 Jun 2010
Type Conference
Year 2006
Where DATE
Authors Görschwin Fey, Sean Safarpour, Andreas G. Veneris, Rolf Drechsler
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