Hybrid BIST Based on Repeating Sequences and Cluster Analysis

We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use cluster analysis for sequence extraction, and encode deterministic patterns on the basis of the stored sequences. Experimental results for the ISCAS-89 benchmark circuits show that the proposed approach often requires less on-chip storage and test data volume than other recent BIST methods.

• Type: Conference
• Year: 2005
• Where: DATE
• Authors: Lei Li, Krishnendu Chakrabarty
• Keywords: DATE 2005, Deterministic Test Patterns, Extracted Sequences, Hardware, Hybrid Bist Approach