New Schemes for Self-Testing RAM

This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and single- or dual-port RAM’s. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.

• Type: Conference
• Year: 2005
• Where: DATE
• Authors: Ghenadie Bodean, D. Bodean, A. Labunetz
• Keywords: DATE 2005, Essential Particularity, Hardware, Random Access Memories, Testing Wide Type