A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment

14 years 5 months ago

Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia

DFT 2003 | Hardware |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	DFT
Authors	Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, S. Max, Phil Perkinson

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