Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of the circuits. In this paper, we propose novel layout-aware pseudofunctional testing techniques to tackle the above problem. Firstly, by taking the circuit layout information into account, functional constraints related to delay faults on critical paths are extracted. Then, we generate functionally-reachable test cubes for every true critical path in the circuit. Finally, we fill the don’t-care bits in the test cubes to maximize power supply noises on critical paths under the consideration of functional constraints. The effectiveness of the proposed methodology is verified with large ISCAS’89 benchmark circuits.

• Type: Conference
• Year: 2010
• Where: DATE
• Authors: Xiao Liu, Yubin Zhang, Feng Yuan, Qiang Xu
• Keywords: Critical Paths, DATE 2010, Delay Faults, Hardware, Test Cubes