Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits

Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. In contrast to previous approaches, the methodology aims at providing coverage in terms of all the circuit components while minimizing the loading overhead by reducing the number of internal circuit nodes that need to be tapped. Parameter tolerances are incorporated through either statistical or mathematical analysis to determine the threshold for failure alarm. Experimental results confirm that full coverage can be attained while keeping the hardware overhead within a pre-specified budget.

• Type: Conference
• Year: 2002
• Where: ICCD
• Authors: Sule Ozev, Alex Orailoglu
• Keywords: Concurrent Detection, Concurrent Failure Detection, ICCD 2002, Linear Analog Systems