Testing for tunneling opens

A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretical calculations as well as Boolean and IDDQ experiments confirm the existence of tunneling opens. The Murphy experimental data show that seven out of nine VLV-only failure circuits can be explained by this failure mode. All these seven circuits survived 366 hours temperature burn-in. Finally, a cost effective screening strategy is proposed.

• Type: Conference
• Year: 2000
• Where: ITC
• Authors: Chien-Mo James Li, Edward J. McCluskey
• Keywords: At-speed Boolean Tests, Failure Mode, Hardware, ITC 2000, Tunneling-open Failure Mode