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ASPDAC
2000
ACM

A sigma-delta modulation based BIST scheme for mixed-signal circuits

14 years 3 months ago
A sigma-delta modulation based BIST scheme for mixed-signal circuits
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
Jiun-Lang Huang, Kwang-Ting Cheng
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where ASPDAC
Authors Jiun-Lang Huang, Kwang-Ting Cheng
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