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DFT
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DFT 1999
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Determination of Yield Bounds Prior to Routing
14 years 25 days ago
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euler.ecs.umass.edu
Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micron technologies
Arunshankar Venkataraman, Israel Koren
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Circuit Manufacturing Complexities
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Deep Sub-micron Technologies
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DFT 1999
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VLSI
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Added
03 Aug 2010
Updated
03 Aug 2010
Type
Conference
Year
1999
Where
DFT
Authors
Arunshankar Venkataraman, Israel Koren
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VLSI Study Group
Computer Vision