Determination of Yield Bounds Prior to Routing

Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micron technologies

• Type: Conference
• Year: 1999
• Where: DFT
• Authors: Arunshankar Venkataraman, Israel Koren
• Keywords: Circuit Manufacturing Complexities, Deep Sub-micron Technologies, DFT 1999, VLSI