DFT
1999
IEEE
14 years 3 months ago
1999
IEEE
Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micr...
ISLPED
2005
ACM
14 years 5 months ago
2005
ACM
Heat is a main concern for processors in deep sub-micron technologies. The chip temperature is affected by both the power consumption of processor components and the chip layout....
IOLTS
2006
IEEE
14 years 5 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...