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27

GLVLSI
1999
IEEE

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Pseudo-Exhaustive Testing of Sequential Circuits

14 years 3 months ago

Pseudo-Exhaustive Testing of Sequential Circuits

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Bassam Shaer, Sami A. Al-Arian, David L. Landis

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GLVLSI 1999 | VLSI |

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Added	03 Aug 2010
Updated	03 Aug 2010
Type	Conference
Year	1999
Where	GLVLSI
Authors	Bassam Shaer, Sami A. Al-Arian, David L. Landis

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