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ITC
1999
IEEE

Delay testing of SOI circuits: Challenges with the history effect

14 years 3 months ago
Delay testing of SOI circuits: Challenges with the history effect
Eric MacDonald, Nur A. Touba
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1999
Where ITC
Authors Eric MacDonald, Nur A. Touba
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