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ICCAD
1993
IEEE

Reconfigurable scan chains: a novel approach to reduce test application time

14 years 5 months ago
Reconfigurable scan chains: a novel approach to reduce test application time
Sridhar Narayanan, Melvin A. Breuer
Added 08 Aug 2010
Updated 08 Aug 2010
Type Conference
Year 1993
Where ICCAD
Authors Sridhar Narayanan, Melvin A. Breuer
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