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ITC
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ITC 1994
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Transparent Memory Testing for Pattern-Sensitive Faults
14 years 20 days ago
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mark.bu.edu
Mark G. Karpovsky, Vyacheslav N. Yarmolik
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Added
09 Aug 2010
Updated
09 Aug 2010
Type
Conference
Year
1994
Where
ITC
Authors
Mark G. Karpovsky, Vyacheslav N. Yarmolik
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Researcher Info
Hardware Study Group
Computer Vision