ITC
1992
IEEE
14 years 3 months ago
1992
IEEE
ITC
1992
IEEE
14 years 3 months ago
1992
IEEE
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
ITC
1992
IEEE
14 years 3 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...