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This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hass...
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vi...