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40

ITC
1995
IEEE

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Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST

14 years 3 months ago

Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST

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Kwang-Ting Cheng, Chih-Jen Lin

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Hardware | ITC 1995 |

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Added	26 Aug 2010
Updated	26 Aug 2010
Type	Conference
Year	1995
Where	ITC
Authors	Kwang-Ting Cheng, Chih-Jen Lin

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