A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
Real-world data is known to be imperfect, suffering from various forms of defects such as sensor variability, estimation errors, uncertainty, human errors in data entry, and gaps ...
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
Piero Franco, William D. Farwell, Robert L. Stokes...